The application of analytical SEM and EDS in the earth sciences: the Tabletop Microscopes TM4000

Monday, 25 May 2020, 10:00-12:30

Instructor: Massimo Tagliaferro

Learn basic theory and practice the methods used in electron beam-based analysis and data interpretation. Electron beam-based analysis and data interpretation have many applications within earth sciences and beyond.
Understanding how analytical scanning electron microscopy (SEM) and Energy Dispersive X-ray Spectrometer (EDS) can be used and how the data these instruments produce can be interpreted can unlock breakthroughs in research.

About the workshop

This 3-hours workshop explores electron beam analysis, including interactions between electrons and the specimen, emission of x-rays from the sample, detectors, quantitative analysis, assessing data quality, its interpretation and presentation.

Topics
• Basics of the scanning electron microscopy and focused ion beam instruments (construction principles, signals, interaction with the sample)
• Advanced imaging modes: low tension microscopy, high vacuum,
• Chemical analyses with EDS

This course is taught in English and is limited to a maximum of 12 participants.

For information and application to Workshop SEM fill the google form or send an email to This email address is being protected from spambots. You need JavaScript enabled to view it.

Please indicate “Workshop SEM” in the subject. Participations are limited to the places available: you will be informed concerning the acceptance of your application at the beginning of April.